Bruker (courtesy of Bruker)

Live From the Lab: Thin Film Thickness and More with DIFFRAC.XRR

Thin films are often applied to surfaces to modify their properties. They are also used to create next generation sensors and microelectronic devices. As the thickness of films approach nanometer scales, it is important to have a tool for quantifying their thickness. X-ray Reflectometry (XRR) is a method used to quantify the thickness, density and roughness of thin films. In this episode of Live From the Lab, we will discuss XRR and see how to analyze measurements in DIFFRAC.XRR.